Rapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysis
| dc.contributor.author | Hudson, Maribel | |
| dc.contributor.author | Nation, Jonathan | |
| dc.contributor.author | Rippstein, Travis | |
| dc.contributor.author | Wiley, Mark | |
| dc.contributor.author | Chyan, Frederick | |
| dc.creator | Hudson, Maribel | en_US |
| dc.creator | Nation, Jonathan | en_US |
| dc.creator | Rippstein, Travis | en_US |
| dc.creator | Wiley, Mark | en_US |
| dc.creator | Chyan, Frederick | en_US |
| dc.date.accessioned | 2011-10-26T19:50:45Z | |
| dc.date.available | 2011-10-26T19:50:45Z | |
| dc.date.issued | 2009-05 | |
| dc.identifier.citation | Hudson, Maribel, Nation, Jonathan, Rippstein, Travis, Wiley, Mark, & Chyan, Frederick. (2009). Rapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysis (Bachelor's thesis, University of Arizona, Tucson, USA). | |
| dc.identifier.uri | http://hdl.handle.net/10150/157408 | |
| dc.language.iso | en | en_US |
| dc.publisher | The University of Arizona. | en_US |
| dc.rights | Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author. | en_US |
| dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | |
| dc.title | Rapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysis | en_US |
| dc.type | text | en_US |
| dc.type | Electronic Thesis | en_US |
| thesis.degree.grantor | University of Arizona | en_US |
| thesis.degree.level | bachelors | en_US |
| thesis.degree.discipline | Honors College | en_US |
| thesis.degree.discipline | Computer Engineering | en_US |
| thesis.degree.name | B.S. | en_US |
| refterms.dateFOA | 2018-06-30T21:15:31Z |
