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dc.contributor.authorRippstein, Travis Jonathan
dc.contributor.authorHudson, Maribel
dc.contributor.authorNation, Jonathan
dc.contributor.authorChyan, Frederick
dc.contributor.authorWiley, Mark
dc.creatorRippstein, Travis Jonathanen_US
dc.creatorHudson, Maribelen_US
dc.creatorNation, Jonathanen_US
dc.creatorChyan, Fredericken_US
dc.creatorWiley, Marken_US
dc.date.accessioned2011-10-26T19:54:17Z
dc.date.available2011-10-26T19:54:17Z
dc.date.issued2009-05
dc.identifier.urihttp://hdl.handle.net/10150/157473
dc.language.isoenen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.titleRapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysisen_US
dc.typetexten_US
dc.typeElectronic Thesisen_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelbachelorsen_US
thesis.degree.disciplineHonors Collegeen_US
thesis.degree.disciplineComputer Engineeringen_US
thesis.degree.nameB.S.en_US
refterms.dateFOA2018-06-18T03:45:34Z


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