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dc.contributor.advisorPrince, John L.en_US
dc.contributor.authorCooke, Bradly James.en_US
dc.creatorCooke, Bradly James.en_US
dc.date.accessioned2011-10-31T17:21:09Zen
dc.date.available2011-10-31T17:21:09Zen
dc.date.issued1989en_US
dc.identifier.urihttp://hdl.handle.net/10150/184876en
dc.description.abstractThis dissertation investigates the implementation of S-parameter based network techniques for the analysis of multiconductor, high speed VLSI integrated circuit and packaging interconnects. The S-parameters can be derived from three categories of input parameters: (1) lossy quasi-static R,L,C and G, (2) lossy frequency dependent (dispersive) R,L,C,G and (3) the propagation constants, Γ, the characteristic impedance, Z(c) and the conductor eigencurrents, I, derived from full wave analysis. The S-parameter network techniques developed allow for: the analysis of periodic waveform excitation, the incorporation of externally measured or calculated scattering parameter data and large system analysis through macro decomposition. The inclusion of non-linear terminations has also been developed.
dc.language.isoenen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectElectric circuit analysisen_US
dc.subjectElectronic circuit designen_US
dc.subjectIntegrated circuits -- Very large scale integration -- Design and constructionen_US
dc.titleS-parameter VLSI transmission line analysis.en_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.identifier.oclc703432287en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.leveldoctoralen_US
dc.contributor.committeememberSchrimpf, Ronald D.en_US
dc.contributor.committeememberCangellaris, Andreasen_US
dc.contributor.committeememberMcCullen, John D.en_US
dc.identifier.proquest9013138en_US
thesis.degree.disciplineElectrical and Computer Engineeringen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.namePh.D.en_US
refterms.dateFOA2018-08-22T22:30:52Z
html.description.abstractThis dissertation investigates the implementation of S-parameter based network techniques for the analysis of multiconductor, high speed VLSI integrated circuit and packaging interconnects. The S-parameters can be derived from three categories of input parameters: (1) lossy quasi-static R,L,C and G, (2) lossy frequency dependent (dispersive) R,L,C,G and (3) the propagation constants, Γ, the characteristic impedance, Z(c) and the conductor eigencurrents, I, derived from full wave analysis. The S-parameter network techniques developed allow for: the analysis of periodic waveform excitation, the incorporation of externally measured or calculated scattering parameter data and large system analysis through macro decomposition. The inclusion of non-linear terminations has also been developed.


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