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dc.contributor.authorPatel, Mayank Raman.
dc.creatorPatel, Mayank Raman.en_US
dc.date.accessioned2013-03-21T11:54:43Z
dc.date.available2013-03-21T11:54:43Z
dc.date.issued1985en_US
dc.identifier.urihttp://hdl.handle.net/10150/275246
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectDigital integrated circuits -- Testing.en_US
dc.titleHARDWARE COMPILER DRIVEN HEURISTIC SEARCH FOR DIGITAL IC TEST SEQUENCES.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.identifier.oclc13240520en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
dc.identifier.proquest1325060en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineElectrical and Computer Engineeringen_US
thesis.degree.nameM.S.en_US
dc.identifier.bibrecord.b15615686en_US
refterms.dateFOA2018-08-16T16:53:45Z


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