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dc.contributor.authorMatsumori, Barry Alan.*
dc.creatorMatsumori, Barry Alan.en_US
dc.date.accessioned2013-03-21T11:57:15Z
dc.date.available2013-03-21T11:57:15Z
dc.date.issued1985en_US
dc.identifier.urihttp://hdl.handle.net/10150/275313
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectIntegrated circuits -- Very large scale integration -- Reliability.en_US
dc.subjectIntegrated circuits -- Large scale integration -- Reliability.en_US
dc.titleQUALIFICATION RESEARCH FOR RELIABLE, CUSTOM LSI/VLSI ELECTRONICS.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.identifier.oclc13791392en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
dc.identifier.proquest1325578en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineElectrical and Computer Engineeringen_US
thesis.degree.nameM.S.en_US
dc.identifier.bibrecord.b1555577xen_US
refterms.dateFOA2018-07-06T04:56:10Z


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