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dc.contributor.advisorShack, Roland V.en_US
dc.contributor.authorWilliams, Valorie Sharron, 1960-
dc.creatorWilliams, Valorie Sharron, 1960-en_US
dc.date.accessioned2013-03-28T10:13:48Zen
dc.date.available2013-03-28T10:13:48Zen
dc.date.issued1988en_US
dc.identifier.urihttp://hdl.handle.net/10150/276691en
dc.description.abstractA new type of computer-controlled instrument has been developed to measure microviscoelastic properties of thin materials. It can independently control and measure indentation loads and depths in situ revealing information about material creep and relaxation. Sample and indenter positions are measured with a specially designed polarization interferometer. Indenter loadings can be varied between 0.5 and 10 grams and held constant to ±41 mg. The resulting indentation depths can be measured in situ to ±1.2 nm. The load required to maintain constant indentation depths from 0.1 to 5.0 microns can be measured in situ to ±3.3 mg and the depth held constant to ±15 nm.
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectPolarization interferometers.en_US
dc.subjectMaterials -- Creep -- Testing.en_US
dc.subjectPlasticity -- Testing.en_US
dc.subjectStress relaxation -- Testing.en_US
dc.titleIn situ microviscoelastic measurements by polarization interferometryen_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.identifier.oclc20450387en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
dc.identifier.proquest1333270en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.nameM.S.en_US
dc.identifier.bibrecord.b17007628en_US
refterms.dateFOA2018-08-27T09:16:10Z
html.description.abstractA new type of computer-controlled instrument has been developed to measure microviscoelastic properties of thin materials. It can independently control and measure indentation loads and depths in situ revealing information about material creep and relaxation. Sample and indenter positions are measured with a specially designed polarization interferometer. Indenter loadings can be varied between 0.5 and 10 grams and held constant to ±41 mg. The resulting indentation depths can be measured in situ to ±1.2 nm. The load required to maintain constant indentation depths from 0.1 to 5.0 microns can be measured in situ to ±3.3 mg and the depth held constant to ±15 nm.


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