In situ microviscoelastic measurements by polarization interferometry
| dc.contributor.advisor | Shack, Roland V. | en_US |
| dc.contributor.author | Williams, Valorie Sharron, 1960- | |
| dc.creator | Williams, Valorie Sharron, 1960- | en_US |
| dc.date.accessioned | 2013-03-28T10:13:48Z | en |
| dc.date.available | 2013-03-28T10:13:48Z | en |
| dc.date.issued | 1988 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10150/276691 | en |
| dc.description.abstract | A new type of computer-controlled instrument has been developed to measure microviscoelastic properties of thin materials. It can independently control and measure indentation loads and depths in situ revealing information about material creep and relaxation. Sample and indenter positions are measured with a specially designed polarization interferometer. Indenter loadings can be varied between 0.5 and 10 grams and held constant to ±41 mg. The resulting indentation depths can be measured in situ to ±1.2 nm. The load required to maintain constant indentation depths from 0.1 to 5.0 microns can be measured in situ to ±3.3 mg and the depth held constant to ±15 nm. | |
| dc.language.iso | en_US | en_US |
| dc.publisher | The University of Arizona. | en_US |
| dc.rights | Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author. | en_US |
| dc.subject | Polarization interferometers. | en_US |
| dc.subject | Materials -- Creep -- Testing. | en_US |
| dc.subject | Plasticity -- Testing. | en_US |
| dc.subject | Stress relaxation -- Testing. | en_US |
| dc.title | In situ microviscoelastic measurements by polarization interferometry | en_US |
| dc.type | text | en_US |
| dc.type | Thesis-Reproduction (electronic) | en_US |
| dc.identifier.oclc | 20450387 | en_US |
| thesis.degree.grantor | University of Arizona | en_US |
| thesis.degree.level | masters | en_US |
| dc.identifier.proquest | 1333270 | en_US |
| thesis.degree.discipline | Graduate College | en_US |
| thesis.degree.discipline | Optical Sciences | en_US |
| thesis.degree.name | M.S. | en_US |
| dc.identifier.bibrecord | .b17007628 | en_US |
| refterms.dateFOA | 2018-08-27T09:16:10Z | |
| html.description.abstract | A new type of computer-controlled instrument has been developed to measure microviscoelastic properties of thin materials. It can independently control and measure indentation loads and depths in situ revealing information about material creep and relaxation. Sample and indenter positions are measured with a specially designed polarization interferometer. Indenter loadings can be varied between 0.5 and 10 grams and held constant to ±41 mg. The resulting indentation depths can be measured in situ to ±1.2 nm. The load required to maintain constant indentation depths from 0.1 to 5.0 microns can be measured in situ to ±3.3 mg and the depth held constant to ±15 nm. |
