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dc.contributor.authorTuschel, David Daniel, 1957-
dc.creatorTuschel, David Daniel, 1957-en_US
dc.date.accessioned2013-03-28T10:26:00Zen
dc.date.available2013-03-28T10:26:00Zen
dc.date.issued1986en_US
dc.identifier.urihttp://hdl.handle.net/10150/277026en
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectSurface chemistry.en_US
dc.subjectSurface roughness.en_US
dc.subjectRaman effect, Surface enhanced.en_US
dc.subjectOxidation-reduction reaction.en_US
dc.titleA CHARACTERIZATION OF THE OXIDATION-REDUCTION CYCLE AND SURFACE MORPHOLOGY OF ELECTROCHEMICAL SURFACE ENHANCED RAMAN SCATTERINGen_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.identifier.oclc17262771en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
dc.identifier.proquest1329503en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineChemistryen_US
thesis.degree.nameM.S.en_US
dc.identifier.bibrecord.b16248132en_US
refterms.dateFOA2018-08-16T00:33:07Z


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