Applications of scanning force microscopy to magnetic and electronic media

Abstract

A scanning force microscope is an instrument which can image the forces present on a sample with high resolution. These forces include magnetic, electric, and atomic forces. The scanning force microscope uses either a tunneling, capacitive or optical method of sensing the motion of a lever-tip mechanical system that reacts to the forces present on a sample. There are four optical methods used in scanning force microscopy: heterodyne, homodyne, deflection and laser feedback. In this thesis, two implementations of the laser feedback method of detecting lever motion are described: a fiber coupled laser diode feedback and a tightly coupled laser diode feedback. The theory of interactions between a tip and the magnetic or electric fields at the surface of a sample are presented, along with the theory of the laser diode feedback. The limiting noises inherent in the system are discussed and representative values are given. Results of the sensitivity of the two systems are presented, and images of electric forces acting on the tip from interdigitated electrodes are demonstrated.