AuthorYu, Tein-Yow, 1961-
KeywordsIntegrated circuits -- Testing.
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PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractThis thesis addresses the problem of backtracking strategies in test generation. First, a methodology which uses status of absolute dominators as a means for causing backtracking during the test generation process is presented. Then, different heuristics that force the test generation to execute the backtracking procedure are investigated. Experiments which generated test patterns for over 30,000 faults have been used to evaluate these heuristics. According to the experimental results, we recommend a new backtracking strategy that has the best performance among the six strategies explored in this thesis.
Degree ProgramGraduate College
Electrical and Computer Engineering