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    Efficient reconfiguration by degradation in defect-tolerant VLSI arrays

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    azu_td_1339202_sip1_m.pdf
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    Author
    Chen, Ing-yi, 1962-
    Issue Date
    1989
    Keywords
    Integrated circuits -- Very large scale integration -- Design and construction.
    Advisor
    Kuo, Sy-Yen
    
    Metadata
    Show full item record
    Publisher
    The University of Arizona.
    Rights
    Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
    Abstract
    This thesis addresses the problem of constructing a flawless subarray from a defective VLSI/WSI array consists of identical cells such as memory cells or processors. In contrast to the redundancy approach in which some cells are dedicated as spares, all the cells in the degradation approach are treated in a uniform way. Each cell can be either fault-free or defective and a subarray which contains no faulty cell is derived under constraints of switching and routing mechanisms. Although extensive literatures exist concerning spare allocation and reconfiguration in arrays with redundancy, little research has been published on optimal reconfiguration in a degradable array. A systematic method based on graph theoretic models is developed to deal with the problem. The complexities of reconfiguration are analyzed for schemes using different switching mechanisms. Efficient heuristic algorithms are presented to determine a target subarray from the defective host array.
    Type
    text
    Thesis-Reproduction (electronic)
    Degree Name
    M.S.
    Degree Level
    masters
    Degree Program
    Graduate College
    Electrical Engineering
    Degree Grantor
    University of Arizona
    Collections
    Master's Theses

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