Electromagnetic characterization of shielded multiconductor microstrip-line discontinuities using the time-domain finite-difference method
AuthorChan, Michael, 1963-
AdvisorCangellaris, Andreas C.
MetadataShow full item record
PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractThe time-domain finite difference (TD-FD) method is applied to obtain the frequency-dependent characteristics of shielded multiconductor microstrip line interconnect structures. A Gaussian pulse is used as the excitation source and the reflected, transmitted, and coupled pulses on the various lines are used for the calculation of the frequency-dependent elements in the scattering matrix representation of the structure. In order to correctly specify the frequency range of applicability of the results, the cutoff frequencies of the higher-order modes of the structures under consideration need to be found. This is done by a two-dimensional application of the TD-FD method over the cross-section of the multiconductor transmission line, based on the simple observation that modes at cutoff are characterized by the fact that ∂/∂z = 0 where z is the direction of propagation along the axis of the line. Numerical results are obtained for the dispersive characteristics of coupled microstrip lines and the frequency-dependent scattering parameters of a microstrip open-end line, a 90° bend, a right-angle via, and the discontinuity which occurs when one of the two lines is terminated in a coupled symmetric microstrip geometry.