AuthorHsu, Jiunn-Yann, 1959-
AdvisorBickel, William S.
MetadataShow full item record
PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractThe light scattered from a scatterer depends on the geometrical properties such as size, shape, and their distributions as well as electromagnetic properties such as the complex index of reflection. The four major Mueller scattering matrix elements have been experimentally measured for an aluminum rough surface scattering laser light at lambda = 441.6nm for various incident angles. Measurements were also made for non-conducting diffuse surface and an aluminum coated diffuse surface. The sixteen Mueller matrix elements of these diffuse surfaces were measured in order to study the relative role of reflectance and roughness for scattering from a rough surface. Some representative matrix elements for the rough surfaces as well as for conducting and non-conducting rough surfaces are shown. S11 and S34 are sensitive to illumination angles and surface variation. S33 are sensitive to illumination angles only. S34 are very sensitive to the change of refractive index from real to complex.