Electronic manufacturing test cell automation and configuration using AI techniques

Abstract

This thesis utilizes artificial intelligence techniques and problem specific knowledge to assist in the design of an manufacturing test cell for electronic products. The electronic printed circuit board (PCB) is subjected to one or more functional evaluation(s) during the manufacturing process. The purpose of these evaluations is to assure product quality. This thesis is focused on, with historical knowledge, the configuration of this testing environment and associated fault isolation processes. By using such knowledge, an improvement in the testing efficiency will be realized which will allow the overall product cost to be minimized.