AdvisorCangellaris, Andreas C.
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PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractA method to predict appropriate dielectric constants and thicknesses for double dielectric substrate microstrip structures to minimize forward crosstalk is presented. Ratios of the elements in the capacitance matrix are compared to those in the inductance matrix to determine if forward crosstalk will be minimized. Curves showing C(rat) where C(rat) is the ratio of the C₁₁ element to the C₁₂ element, as a function of the relative permitivity, εᵣ and SPICE simulations are presented for particular geometries. The method accurately predicts combinations of dielectrics that will produce a structure exhibiting greatly reduced crosstalk.