AN HEURISTIC SEARCH APPROACH TO TEST SEQUENCE GENERATION FOR AHPL (A HARDWARE PROGRAMMING LANGUAGE) DESCRIBED SYNCHRONOUS SEQUENTIAL CIRCUITS
AuthorBelt, John Edward, 1933-
KeywordsDigital integrated circuits -- Testing.
Logic circuits -- Testing.
Electric fault location -- Data processing.
AHPL (Computer program language)
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PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Degree ProgramGraduate College