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dc.contributor.authorKoert, Peter, 1934-
dc.creatorKoert, Peter, 1934-en_US
dc.date.accessioned2013-05-02T10:09:09Z
dc.date.available2013-05-02T10:09:09Z
dc.date.issued1975en_US
dc.identifier.urihttp://hdl.handle.net/10150/288366
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectAluminum films.en_US
dc.titleTHERMAL GRADIENTS, THE ELECTRON WIND AND THIN FILM FAILURE RATESen_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.identifier.oclc1918314en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.leveldoctoralen_US
dc.identifier.proquest7517828en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineElectrical Engineeringen_US
thesis.degree.namePh.D.en_US
dc.description.noteThis item was digitized from a paper original and/or a microfilm copy. If you need higher- resolution images for any content in this item, please contact us at repository@u.library.arizona.edu.
dc.identifier.bibrecord.b18185162en_US
dc.description.admin-noteOriginal file replaced with corrected file July 2023.
refterms.dateFOA2018-08-29T02:28:28Z


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