AdvisorMacleod, H. Angus
MetadataShow full item record
PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractIn this work we present a non-iterative technique for computing the steady-state optical properties of nonlinear multilayers and we examine nonlinear multilayer designs for optical limiters. Optical limiters are filters with intensity-dependent transmission designed to curtail the transmission of incident light above a threshold irradiance value in order to protect optical sensors from damage due to intense light. Thin film multilayers composed of nonlinear materials exhibiting an intensity-dependent refractive index are used as the basis for optical limiter designs in order to enhance the nonlinear filter response by magnifying the electric field in the nonlinear materials through interference effects. The nonlinear multilayer designs considered in this work are based on linear optical interference filter designs which are selected for their spectral properties and electric field distributions. Quarter wave stacks and cavity filters are examined for their suitability as sensor protectors and their manufacturability. The underlying non-iterative technique used to calculate the optical response of these filters derives from recognizing that the multi-valued calculation of output irradiance as a function of incident irradiance may be turned into a single-valued calculation of incident irradiance as a function of output irradiance. Finally, the benefits and drawbacks of using nonlinear multilayer for optical limiting are examined and future research directions are proposed.
Degree ProgramGraduate College