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dc.contributor.authorBooth, Donald Clarke*
dc.creatorBooth, Donald Clarkeen_US
dc.date.accessioned2013-05-09T11:28:08Zen
dc.date.available2013-05-09T11:28:08Zen
dc.date.issued1980en_US
dc.identifier.urihttp://hdl.handle.net/10150/290542en
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectThin films -- Optical properties.en_US
dc.subjectSilicon alloys -- Optical properties.en_US
dc.titleTHE RETARDATION OF CRYSTALLIZATION OF CVD AMORPHOUS SILICON AND THE STUDY OF ITS STRUCTURAL AND OPTICAL PROPERTIESen_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.identifier.oclc7483687en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.leveldoctoralen_US
dc.identifier.proquest8102243en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.namePh.D.en_US
dc.identifier.bibrecord.b13405925en_US
refterms.dateFOA2018-08-17T23:13:03Z


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