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dc.contributor.authorVan Wyck, Neal Edward
dc.creatorVan Wyck, Neal Edwarden_US
dc.date.accessioned2013-05-16T09:18:34Z
dc.date.available2013-05-16T09:18:34Z
dc.date.issued1985en_US
dc.identifier.urihttp://hdl.handle.net/10150/291294
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectThin films -- Spectra.en_US
dc.subjectRaman effect.en_US
dc.subjectSpectrum analysis.en_US
dc.subjectCatalysts.en_US
dc.titleMULTIPHOTON SPECTROSCOPY OF THIN FILMS AND SURFACES (NONLINEAR, WAVEGUIDES, INTERFACES)en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.identifier.oclc13611253en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
dc.identifier.proquest1325628en_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineChemistryen_US
thesis.degree.nameM.S.en_US
dc.identifier.bibrecord.b15513178en_US
refterms.dateFOA2018-04-26T11:05:56Z


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