A scanning grating technique for measurement of submicron focused spots
dc.contributor.advisor | Kostuk, Raymond K. | en_US |
dc.contributor.author | Mortimer, Beth Ann, 1965- | |
dc.creator | Mortimer, Beth Ann, 1965- | en_US |
dc.date.accessioned | 2013-05-16T09:31:02Z | |
dc.date.available | 2013-05-16T09:31:02Z | |
dc.date.issued | 1988 | en_US |
dc.identifier.uri | http://hdl.handle.net/10150/291569 | |
dc.description.abstract | Many applications in optical research require the use of diffraction limited point images with reduced spot sizes. The instrumentation that evaluates these small diameter images must have high resolution (sub-micron) capabilities. One method used to measure sub-micron optical point images is a scanning grating technique. However, many characteristics of this measurement technique have not been fully examined. In this paper, the sensitivity of this measurement technique to the scanning mechanism, beam characteristics, and grating tilt is evaluated. | |
dc.language.iso | en_US | en_US |
dc.publisher | The University of Arizona. | en_US |
dc.rights | Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author. | en_US |
dc.subject | Optical storage devices -- Equipment and supplies. | en_US |
dc.subject | Diffraction gratings. | en_US |
dc.subject | Scanning systems. | en_US |
dc.title | A scanning grating technique for measurement of submicron focused spots | en_US |
dc.type | text | en_US |
dc.type | Thesis-Reproduction (electronic) | en_US |
dc.identifier.oclc | 22271741 | en_US |
thesis.degree.grantor | University of Arizona | en_US |
thesis.degree.level | masters | en_US |
dc.identifier.proquest | 1335432 | en_US |
thesis.degree.discipline | Graduate College | en_US |
thesis.degree.discipline | Electrical and Computer Engineering | en_US |
thesis.degree.name | M.S. | en_US |
dc.identifier.bibrecord | .b17390540 | en_US |
refterms.dateFOA | 2018-08-30T00:55:08Z | |
html.description.abstract | Many applications in optical research require the use of diffraction limited point images with reduced spot sizes. The instrumentation that evaluates these small diameter images must have high resolution (sub-micron) capabilities. One method used to measure sub-micron optical point images is a scanning grating technique. However, many characteristics of this measurement technique have not been fully examined. In this paper, the sensitivity of this measurement technique to the scanning mechanism, beam characteristics, and grating tilt is evaluated. |