Identifications of Monolayer Molybdenum Disulfide Flakes for Transistor Devices
AuthorCurley, Sheridan Sharer
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PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractThis thesis covers useful methods for the identification of atomically thin molybdenum disulfide (MoS₂) flakes, outlines fabrication steps for transistors from identified monolayer MoS₂ samples, and details several potential measurements from such transistors. Identification techniques covered include atomic force microscopy, Raman analysis, and photoluminescence measurements of MoS₂. Detailed manufacturing procedures for different types of transistor devices are presented, beginning from large, bulk MoS₂ crystals, proceeding to wiring and testing of functional devices. Although transport measurements are not provided, all necessary theory and fabrication steps are covered to begin such measurements quickly from a basic initial setup.
Degree ProgramHonors College