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dc.contributor.authorJohnson, Carlton Cowles, 1938-
dc.creatorJohnson, Carlton Cowles, 1938-en_US
dc.date.accessioned2014-06-03T14:55:07Z
dc.date.available2014-06-03T14:55:07Z
dc.date.issued1970en_US
dc.identifier.urihttp://hdl.handle.net/10150/318197
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectSemiconductors -- Reliability.en_US
dc.subjectPhotoconductivity.en_US
dc.titleInvestigation of photo effects in pin semiconductor junctionsen_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.identifier.oclc27089587en_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineElectrical Engineeringen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.nameM.S.en_US
dc.identifier.bibrecord.b30418781en_US
dc.identifier.callnumberE9791 1970 145en_US
refterms.dateFOA2018-08-30T22:15:47Z


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