Evaluation of SCIRTSS performance on sequential circuits biased against random sequences
Issue Date
1974Keywords
SCIRTSS (Computer program)Logic circuits -- Testing.
Electric fault location -- Data processing.
Digital integrated circuits -- Testing.
Metadata
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The University of Arizona.Rights
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.Type
textThesis-Reproduction (electronic)
Degree Name
M.S.Degree Level
mastersDegree Program
Electrical EngineeringGraduate College