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    Thermal Cycling Fatigue Investigation of Surface Mounted Components with Eutectic Tin-Lead Solder Joints

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    ITC_1996_96-18-1.pdf
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    Author
    Bonner, J. K. "Kirk"
    de Silveira, Carl
    Affiliation
    California Institute of Technology
    Issue Date
    1996-10
    Keywords
    Eutectic tin-lead solder
    solder composition
    surface mounted component (SMC)
    dual in-line (DIP) package
    leadless ceramic chip carrier (LCCC)
    gull wing leaded quad flatpack (QFP)
    J-lead leaded chip carrier
    solder joint
    solder joint lead compliance
    printed wiring board (PWB)
    FR-4 epoxy/fiberglass PWB
    printed wiring assembly (PWA)
    solder joint failure
    solder joint reliability
    thermal fatigue failure
    creep failure
    gull wing lead configuration
    butt mount lead configuration
    thermal cycling
    coefficient of thermal expansion (CTE)
    difference in CTE
    dwell time
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    Rights
    Copyright © International Foundation for Telemetering
    Collection Information
    Proceedings from the International Telemetering Conference are made available by the International Foundation for Telemetering and the University of Arizona Libraries. Visit http://www.telemetry.org/index.php/contact-us if you have questions about items in this collection.
    Publisher
    International Foundation for Telemetering
    Journal
    International Telemetering Conference Proceedings
    Abstract
    Eutectic (63% tin-37% lead) or near-eutectic (40% tin-60% lead) tin-lead solder is widely used for creating electrical interconnections between the printed wiring board (PWB) and the components mounted on the board surface. For components mounted directly on the PWB mounting pads, that is, surface mounted components, the tin-lead solder also constitutes the mechanical interconnection. Eutectic solder has a melting point of 183°C (361°F). It is important to realize that its homologous temperature, defined as the temperature in degrees Kelvin over its melting point temperature (T(m)), also in degrees Kelvin, is defined as T/T(m). At room temperature (25°C = 298K), eutectic solder's homologous temperature is 0.65. It is widely acknowledged that materials having a homologous temperature ≥ 0.5 are readily subject to creep, and the solder joints of printed wiring assemblies are routinely exposed to temperatures above room temperature. Hence, solder joints tend to be subject to both thermal fatigue and creep. This can lead to premature failures during service conditions. The geometry, that is, the lead configuration, of the joints can also affect failure. Various geometries are better suited to withstand failure than others. The purpose of this paper is to explore solder joint failures of dual in-line (DIP) integrated circuit components, leadless ceramic chip carriers (LCCCs), and gull wing and J-lead surface mount components mounted on PWBs.
    Sponsors
    International Foundation for Telemetering
    ISSN
    0884-5123
    0074-9079
    Additional Links
    http://www.telemetry.org/
    Collections
    International Telemetering Conference Proceedings, Volume 32 (1996)

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