HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
Affiliation
Kode Inc., a Subsidiary of Odetics Inc.Issue Date
1983-10Metadata
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Copyright © International Foundation for TelemeteringCollection Information
Proceedings from the International Telemetering Conference are made available by the International Foundation for Telemetering and the University of Arizona Libraries. Visit http://www.telemetry.org/index.php/contact-us if you have questions about items in this collection.Abstract
The need for margin analysis in high density digital data storage systems is established. A review of margin analysis techniques is presented. This review includes a discussion of time interval analysis and a series of instruments which have evolved as a means of performing this analysis. Emphasis is given to a high resolution (1 nanosecond) statistically oriented embodiment of such an instrument.Sponsors
International Foundation for TelemeteringISSN
0884-51230074-9079