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dc.contributor.authorMurphy, Frank
dc.date.accessioned2016-06-16T19:55:59Z
dc.date.available2016-06-16T19:55:59Z
dc.date.issued1990-11
dc.identifier.issn0884-5123
dc.identifier.issn0074-9079
dc.identifier.urihttp://hdl.handle.net/10150/613479
dc.descriptionInternational Telemetering Conference Proceedings / October 29-November 02, 1990 / Riviera Hotel and Convention Center, Las Vegas, Nevadaen_US
dc.description.abstractThe built-in diagnostic test has taken on an increased role as a maintenance tool in today’s complex electronic systems. While the ultimate diagnostic would exercise all of the major functions in a system and instantly isolate and identify any fault down to the specific part, many practical problems stand in the way. Using the diagnostic facility installed in a recent frame synchronizer/decommutator for the Jet Propulsion Laboratory (JPL) in Pasadena, the author attempts to show the logical approach, considerations, and compromises necessary to design the best possible diagnostic routine in a telemetry processor.
dc.description.sponsorshipInternational Foundation for Telemeteringen
dc.language.isoen_USen
dc.publisherInternational Foundation for Telemeteringen
dc.relation.urlhttp://www.telemetry.org/en
dc.rightsCopyright © International Foundation for Telemeteringen
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.titleAN ORGANIZED APPROACH TO HARDWARE DIAGNOSTIC DESIGNen_US
dc.typetexten
dc.typeProceedingsen
dc.contributor.departmentAydin Computer and Monitor Divisionen
dc.identifier.journalInternational Telemetering Conference Proceedingsen
dc.description.collectioninformationProceedings from the International Telemetering Conference are made available by the International Foundation for Telemetering and the University of Arizona Libraries. Visit http://www.telemetry.org/index.php/contact-us if you have questions about items in this collection.en
refterms.dateFOA2018-08-16T05:00:54Z
html.description.abstractThe built-in diagnostic test has taken on an increased role as a maintenance tool in today’s complex electronic systems. While the ultimate diagnostic would exercise all of the major functions in a system and instantly isolate and identify any fault down to the specific part, many practical problems stand in the way. Using the diagnostic facility installed in a recent frame synchronizer/decommutator for the Jet Propulsion Laboratory (JPL) in Pasadena, the author attempts to show the logical approach, considerations, and compromises necessary to design the best possible diagnostic routine in a telemetry processor.


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