AN ORGANIZED APPROACH TO HARDWARE DIAGNOSTIC DESIGN
dc.contributor.author | Murphy, Frank | |
dc.date.accessioned | 2016-06-16T19:55:59Z | |
dc.date.available | 2016-06-16T19:55:59Z | |
dc.date.issued | 1990-11 | |
dc.identifier.issn | 0884-5123 | |
dc.identifier.issn | 0074-9079 | |
dc.identifier.uri | http://hdl.handle.net/10150/613479 | |
dc.description | International Telemetering Conference Proceedings / October 29-November 02, 1990 / Riviera Hotel and Convention Center, Las Vegas, Nevada | en_US |
dc.description.abstract | The built-in diagnostic test has taken on an increased role as a maintenance tool in today’s complex electronic systems. While the ultimate diagnostic would exercise all of the major functions in a system and instantly isolate and identify any fault down to the specific part, many practical problems stand in the way. Using the diagnostic facility installed in a recent frame synchronizer/decommutator for the Jet Propulsion Laboratory (JPL) in Pasadena, the author attempts to show the logical approach, considerations, and compromises necessary to design the best possible diagnostic routine in a telemetry processor. | |
dc.description.sponsorship | International Foundation for Telemetering | en |
dc.language.iso | en_US | en |
dc.publisher | International Foundation for Telemetering | en |
dc.relation.url | http://www.telemetry.org/ | en |
dc.rights | Copyright © International Foundation for Telemetering | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | |
dc.title | AN ORGANIZED APPROACH TO HARDWARE DIAGNOSTIC DESIGN | en_US |
dc.type | text | en |
dc.type | Proceedings | en |
dc.contributor.department | Aydin Computer and Monitor Division | en |
dc.identifier.journal | International Telemetering Conference Proceedings | en |
dc.description.collectioninformation | Proceedings from the International Telemetering Conference are made available by the International Foundation for Telemetering and the University of Arizona Libraries. Visit http://www.telemetry.org/index.php/contact-us if you have questions about items in this collection. | en |
refterms.dateFOA | 2018-08-16T05:00:54Z | |
html.description.abstract | The built-in diagnostic test has taken on an increased role as a maintenance tool in today’s complex electronic systems. While the ultimate diagnostic would exercise all of the major functions in a system and instantly isolate and identify any fault down to the specific part, many practical problems stand in the way. Using the diagnostic facility installed in a recent frame synchronizer/decommutator for the Jet Propulsion Laboratory (JPL) in Pasadena, the author attempts to show the logical approach, considerations, and compromises necessary to design the best possible diagnostic routine in a telemetry processor. |