Affiliation
Univ Arizona, Coll Opt SciIssue Date
2016-03-29Keywords
Interferometryophthalmology
on-null testing
aspherics
low-coherence
coherence
reverse raytracing
Contact lenses
Metadata
Show full item recordCitation
Low-coherence interferometer for contact lens surface metrology 2016, 55 (3):034106 Optical EngineeringJournal
Optical EngineeringRights
© 2016 SPIE.Collection Information
This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.Abstract
Contact lens performance depends on a number of lens properties. Many metrology systems have been developed to measure different aspects of a contact lens, but none test the surface figure in reflection to subwavelength accuracy. Interferometric surface metrology of immersed contact lenses is complicated by the close proximity of the surfaces, low surface reflectivity, and instability of the lens. An interferometer to address these issues was developed and is described here. The accuracy of the system is verified by comparison of glass reference sample measurements against a calibrated commercial interferometer. The described interferometer can accurately reconstruct large surface departures from spherical with reverse raytracing. The system is shown to have residual errors better than 0.05% of the measured surface departure for high slope regions. Measurements made near null are accurate to lambda/20. Spherical, toric, and bifocal soft contact lenses have been measured by this system and show characteristics of contact lenses not seen in transmission testing. The measurements were used to simulate a transmission map that matches an actual transmission test of the contact lens to lambda/18. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)ISSN
0091-3286Version
Final published versionSponsors
Johnson & Johnson Vision Care, Inc.Additional Links
http://opticalengineering.spiedigitallibrary.org/article.aspx?doi=10.1117/1.OE.55.3.034106ae974a485f413a2113503eed53cd6c53
10.1117/1.OE.55.3.034106
