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dc.contributor.authorHeideman, Kyle C.
dc.contributor.authorGreivenkamp, John E.
dc.date.accessioned2016-12-02T00:46:54Z
dc.date.available2016-12-02T00:46:54Z
dc.date.issued2016-03-29
dc.identifier.citationLow-coherence interferometer for contact lens surface metrology 2016, 55 (3):034106 Optical Engineeringen
dc.identifier.issn0091-3286
dc.identifier.doi10.1117/1.OE.55.3.034106
dc.identifier.urihttp://hdl.handle.net/10150/621479
dc.description.abstractContact lens performance depends on a number of lens properties. Many metrology systems have been developed to measure different aspects of a contact lens, but none test the surface figure in reflection to subwavelength accuracy. Interferometric surface metrology of immersed contact lenses is complicated by the close proximity of the surfaces, low surface reflectivity, and instability of the lens. An interferometer to address these issues was developed and is described here. The accuracy of the system is verified by comparison of glass reference sample measurements against a calibrated commercial interferometer. The described interferometer can accurately reconstruct large surface departures from spherical with reverse raytracing. The system is shown to have residual errors better than 0.05% of the measured surface departure for high slope regions. Measurements made near null are accurate to lambda/20. Spherical, toric, and bifocal soft contact lenses have been measured by this system and show characteristics of contact lenses not seen in transmission testing. The measurements were used to simulate a transmission map that matches an actual transmission test of the contact lens to lambda/18. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
dc.description.sponsorshipJohnson & Johnson Vision Care, Inc.en
dc.language.isoenen
dc.publisherSPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERSen
dc.relation.urlhttp://opticalengineering.spiedigitallibrary.org/article.aspx?doi=10.1117/1.OE.55.3.034106en
dc.rights© 2016 SPIE.en
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectInterferometryen
dc.subjectophthalmologyen
dc.subjecton-null testingen
dc.subjectasphericsen
dc.subjectlow-coherenceen
dc.subjectcoherenceen
dc.subjectreverse raytracingen
dc.subjectContact lensesen
dc.titleLow-coherence interferometer for contact lens surface metrologyen
dc.typeArticleen
dc.contributor.departmentUniv Arizona, Coll Opt Scien
dc.identifier.journalOptical Engineeringen
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en
dc.eprint.versionFinal published versionen
refterms.dateFOA2018-08-15T11:14:39Z
html.description.abstractContact lens performance depends on a number of lens properties. Many metrology systems have been developed to measure different aspects of a contact lens, but none test the surface figure in reflection to subwavelength accuracy. Interferometric surface metrology of immersed contact lenses is complicated by the close proximity of the surfaces, low surface reflectivity, and instability of the lens. An interferometer to address these issues was developed and is described here. The accuracy of the system is verified by comparison of glass reference sample measurements against a calibrated commercial interferometer. The described interferometer can accurately reconstruct large surface departures from spherical with reverse raytracing. The system is shown to have residual errors better than 0.05% of the measured surface departure for high slope regions. Measurements made near null are accurate to lambda/20. Spherical, toric, and bifocal soft contact lenses have been measured by this system and show characteristics of contact lenses not seen in transmission testing. The measurements were used to simulate a transmission map that matches an actual transmission test of the contact lens to lambda/18. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)


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