Edge Response Characterization of Interferometers and the Effect of Aberrations
AuthorMillstone, Daniel Brucker
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PublisherThe University of Arizona.
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
AbstractAn edge response characterization technique to predict the ITF of an interferometer using non- interferometric measurements has been shown to be effective. This technique eliminates the need for phase objects to be used in the characterization process. Using coherent imaging with an irradiance sensitive detector and an irradiance step as a characterization artifact to determine an interferometer's ITF was proven viable for diffraction limited, defocused, astigmatic, and spherically aberrated systems. Simulations and collected data demonstrated agreement between the interferometric edge response characterization technique results and coherent imaging edge response characterization technique results. The effect that aberrations have on ITF curves has been investigated in this thesis and an understanding of the system behavior under aberrated conditions was investigated.
Degree ProgramGraduate College