Author
Chipman, Russell A.Affiliation
Univ Arizona, Coll Opt SciIssue Date
2017-08-30
Metadata
Show full item recordPublisher
SPIE-INT SOC OPTICAL ENGINEERINGCitation
Russell A. Chipman, "Advances in modeling polarimeter performance", Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 1040707 (30 August 2017); doi: 10.1117/12.2274506; http://dx.doi.org/10.1117/12.2274506Rights
© 2017 SPIE.Collection Information
This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.Abstract
Artifacts in polarimeters are apparent polarization features which are not real but result from the systematic errors in the polarimeter. The polarization artifacts are different between division of focal plane, spectral, and time modulation polarimeters. Artifacts result from many sources such as source properties, micropolarizer arrays, coatings issues, vibrations, and stress birefringence. A modeling examples of polarization artifacts due to a micro-polarizer array polarimeter is presented.ISSN
0277-786XEISSN
1996-756XVersion
Final published versionAdditional Links
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10407/2274506/Advances-in-modeling-polarimeter-performance/10.1117/12.2274506.fullae974a485f413a2113503eed53cd6c53
10.1117/12.2274506