AuthorChipman, Russell A.
AffiliationUniv Arizona, Coll Opt Sci
MetadataShow full item record
PublisherSPIE-INT SOC OPTICAL ENGINEERING
CitationRussell A. Chipman, "Advances in modeling polarimeter performance", Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 1040707 (30 August 2017); doi: 10.1117/12.2274506; http://dx.doi.org/10.1117/12.2274506
Rights© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
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AbstractArtifacts in polarimeters are apparent polarization features which are not real but result from the systematic errors in the polarimeter. The polarization artifacts are different between division of focal plane, spectral, and time modulation polarimeters. Artifacts result from many sources such as source properties, micropolarizer arrays, coatings issues, vibrations, and stress birefringence. A modeling examples of polarization artifacts due to a micro-polarizer array polarimeter is presented.
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