Instantaneous phase mapping deflectometry for dynamic deformable mirror characterization
AffiliationUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA
Univ Arizona, Steward Observ, 933 N Cherry Ave, Tucson, AZ 85719 USA
MetadataShow full item record
PublisherSPIE-INT SOC OPTICAL ENGINEERING
CitationIsaac Trumper, Heejoo Choi, Dae Wook Kim, "Instantaneous phase mapping deflectometry for dynamic deformable mirror characterization," Proc. SPIE 10401, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems, 104010S (5 September 2017); doi: 10.1117/12.2272188
Rights© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
Collection InformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at firstname.lastname@example.org.
AbstractWe present an instantaneous phase mapping deflectometry (PMD) system in the context of measuring a continuous surface deformable mirror (DM). Deflectometry has a high dynamic range, enabling the full range of surfaces generated by the DM to be measured. The recent development of an instantaneous PMD system leverages the simple setup of the PMD system to measure dynamic objects with accuracy similar to an interferometer. To demonstrate the capabilities of this technology, we perform a linearity measurement of the actuator motion in a continuous surface DM, which is critical for closed loop control in adaptive optics applications. We measure the entire set of actuators across the DM as they traverse their full range of motion with a Shack-Hartman wavefront sensor, thereby obtaining the influence function. Given the influence function of each actuator, the DM can produce specific Zernike terms on its surface. We then measure the linearity of the Zernike modes available in the DM software using the instantaneous PMD system. By obtaining the relationship between modes, we can more accurately generate surface profiles composed of Zernike terms. This ability is useful for other dynamic freeform metrology applications that utilize the DM as a null component.
NoteSPIE grants to authors of papers published in an SPIE Journal or Proceedings the right to post an author-prepared version or an official version (preferred version) of the published paper on an internal or external server controlled exclusively by the author/employer, provided that (a) such posting is noncommercial in nature and the paper is made available to users without charge; (b) an appropriate copyright notice and full citation appear with the paper, and (c) a link to SPIE's official online version of the abstract is provided using the DOI (Document Object Identifier) link.
VersionFinal published version
SponsorsLOFT group; Korea Basic Science Institute; II-VI Foundation Block-Gift Program