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dc.contributor.authorTrumper, Isaac
dc.contributor.authorChoi, Heejoo
dc.contributor.authorKim, Dae Wook
dc.date.accessioned2018-05-16T17:36:09Z
dc.date.available2018-05-16T17:36:09Z
dc.date.issued2017
dc.identifier.citationIsaac Trumper, Heejoo Choi, Dae Wook Kim, "Instantaneous phase mapping deflectometry for dynamic deformable mirror characterization," Proc. SPIE 10401, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems, 104010S (5 September 2017); doi: 10.1117/12.2272188en_US
dc.identifier.issn0277-786X
dc.identifier.doi10.1117/12.2272188
dc.identifier.urihttp://hdl.handle.net/10150/627646
dc.description.abstractWe present an instantaneous phase mapping deflectometry (PMD) system in the context of measuring a continuous surface deformable mirror (DM). Deflectometry has a high dynamic range, enabling the full range of surfaces generated by the DM to be measured. The recent development of an instantaneous PMD system leverages the simple setup of the PMD system to measure dynamic objects with accuracy similar to an interferometer. To demonstrate the capabilities of this technology, we perform a linearity measurement of the actuator motion in a continuous surface DM, which is critical for closed loop control in adaptive optics applications. We measure the entire set of actuators across the DM as they traverse their full range of motion with a Shack-Hartman wavefront sensor, thereby obtaining the influence function. Given the influence function of each actuator, the DM can produce specific Zernike terms on its surface. We then measure the linearity of the Zernike modes available in the DM software using the instantaneous PMD system. By obtaining the relationship between modes, we can more accurately generate surface profiles composed of Zernike terms. This ability is useful for other dynamic freeform metrology applications that utilize the DM as a null component.en_US
dc.description.sponsorshipLOFT group; Korea Basic Science Institute; II-VI Foundation Block-Gift Programen_US
dc.language.isoenen_US
dc.publisherSPIE-INT SOC OPTICAL ENGINEERINGen_US
dc.relation.urlhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/10401/104010S/Instantaneous-phase-mapping-deflectometry-for-dynamic-deformable-mirror-characterization/10.1117/12.2272188.fullen_US
dc.rights© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).en_US
dc.subjectDeflectometryen_US
dc.subjectDeformable Mirroren_US
dc.subjectDynamic Metrologyen_US
dc.titleInstantaneous phase mapping deflectometry for dynamic deformable mirror characterizationen_US
dc.typeProceedingsen_US
dc.identifier.eissn1996-756X
dc.contributor.departmentUniv Arizona, Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USAen_US
dc.contributor.departmentUniv Arizona, Steward Observ, 933 N Cherry Ave, Tucson, AZ 85719 USAen_US
dc.identifier.journalASTRONOMICAL OPTICS: DESIGN, MANUFACTURE, AND TEST OF SPACE AND GROUND SYSTEMSen_US
dc.description.noteSPIE grants to authors of papers published in an SPIE Journal or Proceedings the right to post an author-prepared version or an official version (preferred version) of the published paper on an internal or external server controlled exclusively by the author/employer, provided that (a) such posting is noncommercial in nature and the paper is made available to users without charge; (b) an appropriate copyright notice and full citation appear with the paper, and (c) a link to SPIE's official online version of the abstract is provided using the DOI (Document Object Identifier) link.en_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal published versionen_US
refterms.dateFOA2018-05-16T17:36:10Z


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