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dc.contributor.advisorPotter, Barrett
dc.contributor.authorGunanjipalli, Goutham
dc.creatorGunanjipalli, Goutham
dc.date.accessioned2018-06-26T21:55:28Z
dc.date.available2018-06-26T21:55:28Z
dc.date.issued2018
dc.identifier.citationGunanjipalli, Goutham. (2018). Synthesis and Reduction of Copper-Coagulated, Graphene Oxide, Free-Standing Thin Films (Master's thesis, University of Arizona, Tucson, USA.)
dc.identifier.urihttp://hdl.handle.net/10150/628121
dc.description.abstractAs a two-dimensional material, graphene has attracted great interest among the research groups and the industry due to its exceptional electrical, optical and mechanical properties. Currently, the primary methods for mass production of graphene are focused on the solution-processable chemical redox reaction. The oxidation of graphite introduces a large amount of oxygen functional groups attached onto its basal plane or edges, which makes graphene oxide (GO) sheets hydrophilic to form stable dispersions. However, the starting material graphite gradually becomes an insulator during the oxidation process as a part of planar sp2- hybridized geometry transformed to distorted sp3-hybridized geometry, which decreases the electrical conductivity. As a result, the reduction of GO is essential to recover graphene-like electrical conductivity for practical applications. In addition, the hydrophilic property of GO sheets allows coagulation of divalent metal ions in GO. These ions attach onto the GO basal plane and interact with functional groups resulting in GO/metal ion hybrid thin films with excellent electrical conductivity after reduction. In this work, the effect of coagulation of GO using copper ions (Cu2+) on optical and electrical properties of graphene oxide and reduced graphene oxide is studied. Two different reduction schemes were examined: direct, low-temperature annealing in vacuum and laser reduction of GO and GO-Copper films. This study includes the preparation of GO and GO-Cu stable dispersions, the fabrication of free standing thin films using a doctor blade process, the GO reduction, and the structural and electrical conductivity characterization of the resulting materials. Structural studies involved Fourier transform infrared spectroscopy (FTIR) and scanning electron microscopy/ Electron dispersive spectroscopy (SEM/EDS). A four-point probe measurement was used to examine film electrical resistivity.en_US
dc.language.isoen_USen_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.subjectcopper coagulationen_US
dc.subjectelectrical resistivityen_US
dc.subjectfree standing thin filmsen_US
dc.subjectGraphene oxideen_US
dc.subjectlaser reductionen_US
dc.subjectthermal reductionen_US
dc.titleSynthesis and Reduction of Copper-Coagulated, Graphene Oxide, Free-Standing Thin Filmsen_US
dc.typetexten_US
dc.typeElectronic Thesisen_US
thesis.degree.grantorUniversity of Arizonaen_US
thesis.degree.levelmastersen_US
dc.contributor.committeememberMuralidharan, Krishna
dc.contributor.committeememberPotter, Kelly
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.nameM.S.en_US
refterms.dateFOA2018-06-26T21:55:29Z


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