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    Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs

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    Author
    Addamane, Sadhvikas
    Shima, Darryl
    Laurain, Alexandre
    Chan, Hsiu-Ting
    Balakrishnan, Ganesh
    Moloney, Jerome V.
    Affiliation
    Univ Arizona, Ctr Opt Sci
    Issue Date
    2018
    Keywords
    Saturable absorbers
    VECSELs
    degradation mechanism
    TEM
    
    Metadata
    Show full item record
    Publisher
    SPIE-INT SOC OPTICAL ENGINEERING
    Citation
    Sadhvikas Addamane, Darryl Shima, Alexandre Laurain, Hsiu-Ting Chan, Ganesh Balakrishnan, Jerome V. Moloney, "Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs", Proc. SPIE 10515, Vertical External Cavity Surface Emitting Lasers (VECSELs) VIII, 105150T (15 February 2018); doi: 10.1117/12.2290684; https://doi.org/10.1117/12.2290684
    Journal
    VERTICAL EXTERNAL CAVITY SURFACE EMITTING LASERS (VECSELS) VIII
    Rights
    © (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
    Collection Information
    This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.
    Abstract
    Mode-locked VECSELs using SESAMs are a relatively less complex and cost-effective alternative to state-of-the-art ultrafast lasers based on solid-state or fiber lasers. VECSELs have seen considerable progress in device performance in terms of pulse width and peak power in the recent years. However, it appears that the combination of high power and short pulses can cause some irreversible damage to the SESAM. The degradation mechanism, which can lead to a reduction of the VECSEL output power over time, is not fully understood and deserves to be investigated and alleviated in order to achieve stable mode-locking over long periods of time. It is particularly important for VECSEL systems meant to be commercialized, needing long term operation with a long product lifetime. Here, we investigate the performance and robustness of a SESAM-modelocked VECSEL system under intense pulse intensity excitation. The effect of the degradation on the VECSEL performance is investigated using the SESAM in a VECSEL cavity supporting ultrashort pulses, while the degradation mechanism was investigated by exciting the SESAMs with an external femtosecond laser source. The decay of the photoluminescence (PL) and reflectivity under high excitation was monitored and the damaged samples were further analyzed using a thorough Transmission Electron Microscopy (TEM) analysis. It is found that the major contribution to the degradation is the field intensity and that the compositional damage is confined to the DBR region of the SESAM.
    ISSN
    0277-786X
    1996-756X
    DOI
    10.1117/12.2290684
    Version
    Final published version
    Additional Links
    https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10515/2290684/Degradation-mechanism-of-SESAMs-under-intense-ultrashort-pulses-in-modelocked/10.1117/12.2290684.full?SSO=1
    ae974a485f413a2113503eed53cd6c53
    10.1117/12.2290684
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