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dc.contributor.authorAftab, Maham
dc.contributor.authorBurge, James H.
dc.contributor.authorSmith, Greg A.
dc.contributor.authorGraves, Logan
dc.contributor.authorOh, Chang-jin
dc.contributor.authorKim, Dae Wook
dc.date.accessioned2019-04-26T19:28:35Z
dc.date.available2019-04-26T19:28:35Z
dc.date.issued2019-04
dc.identifier.citationAftab, M., Burge, J. H., Smith, G. A., Graves, L., Oh, C. J., & Kim, D. W. (2018). Modal data processing for high resolution deflectometry. International Journal of Precision Engineering and Manufacturing-Green Technology, 1-16.en_US
dc.identifier.issn2288-6206
dc.identifier.issn2198-0810
dc.identifier.doi10.1007/s40684-019-00047-y
dc.identifier.urihttp://hdl.handle.net/10150/632120
dc.description.abstractIn this paper, we present a modal data processing methodology, for reconstructing high resolution surfaces from measured slope data, over rectangular apertures. One of the primary goals is the ability to effectively reconstruct deflectometry measurement data for high resolution and freeform surfaces, such as telescope mirrors. We start by developing a gradient polynomial basis set which can quickly generate a very high number of polynomial terms. This vector basis set, called the G polynomials set, is based on gradients of the Chebyshev polynomials of the first kind. The proposed polynomials represent vector fields that are defined as the gradients of scalar functions. This method yields reconstructions that fit the measured data more closely than those obtained using conventional methods, especially in the presence of defects in the mirror surface and physical blockers/markers such as fiducials used during deflectometry measurements. We demonstrate the strengths of our method using simulations and real metrology data from the Daniel K. Inouye Solar Telescope (DKIST) primary mirror.en_US
dc.description.sponsorshipKorea Basic Science Institute; II-VI Foundation Block granten_US
dc.language.isoenen_US
dc.publisherKOREAN SOC PRECISION ENGen_US
dc.relation.urlhttp://link.springer.com/10.1007/s40684-019-00047-yen_US
dc.rights© Korean Society for Precision Engineering 2019.en_US
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectSurface measurements, numerical approximation and analysisen_US
dc.subjectInstrumentation, measurement, and metrologyen_US
dc.subjectInformation processingen_US
dc.subjectDeflectometryen_US
dc.subjectTestingen_US
dc.titleModal Data Processing for High Resolution Deflectometryen_US
dc.typeArticleen_US
dc.contributor.departmentUniv Arizona, Coll Opt Scien_US
dc.contributor.departmentUniv Arizona, Steward Observen_US
dc.identifier.journalINTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGYen_US
dc.description.note12 month embargo; first Online: 26 February 2019en_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal accepted manuscripten_US
dc.source.journaltitleInternational Journal of Precision Engineering and Manufacturing-Green Technology
dc.source.volume6
dc.source.issue2
dc.source.beginpage255
dc.source.endpage270


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