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dc.contributor.authorGraves, L R
dc.contributor.authorQuach, H
dc.contributor.authorChoi, H
dc.contributor.authorKim, D W
dc.date.accessioned2019-06-19T22:14:06Z
dc.date.available2019-06-19T22:14:06Z
dc.date.issued2019-03-04
dc.identifier.citationL. R. Graves, H. Quach, H. Choi, and D. W. Kim, "Infinite deflectometry enabling 2π-steradian measurement range," Opt. Express 27, 7602-7615 (2019)en_US
dc.identifier.issn1094-4087
dc.identifier.pmid30876322
dc.identifier.doi10.1364/OE.27.007602
dc.identifier.urihttp://hdl.handle.net/10150/632952
dc.description.abstractWe present a novel deflectometry implementation termed Infinite Deflectometry. The technique provides a full aperture surface reconstruction sag map of freeform surfaces, including previously challenging to measure optics such as highly convex surfaces. The method relies on the creation of a virtual source enclosure around the tested optic, which creates a virtual 2 pi-steradian measurement range. To demonstrate the performance, a fast f/1.26 convex optical surface was measured with a commercial interferometer and with the Infinite Deflectometry system. After removing Zernike terms 1 through 37, the metrology tests resulted in absolute RMS surface values of 18.48 nm and 16.26 nm, respectively. Additionally, a freeform Alvarez lens was measured with the new technique and measured 22.34 mu m of surface sag RMS after piston, tip/tilt, and defocus had been removed. The result deviated by 488 nm RMS from a profilometer measurement while standard interferometry failed to measure the Alvarez lens due to its non-nulled wavefront dynamic range limitation. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreementen_US
dc.description.sponsorshipII-VI Foundation Block-Gift Program; Technology Research Initiative Fund Optics/Imaging Program; Korea Basic Science Institute Foundation; Friends of Tucson Optics Endowed Scholarships in Optical Sciencesen_US
dc.language.isoenen_US
dc.publisherOPTICAL SOC AMERen_US
dc.relation.urlhttps://www.osapublishing.org/oe/abstract.cfm?uri=oe-27-5-7602en_US
dc.rights© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreementen_US
dc.titleInfinite deflectometry enabling 2π-steradian measurement rangeen_US
dc.typeArticleen_US
dc.contributor.departmentUniv Arizona, Coll Opt Scien_US
dc.contributor.departmentUniv Arizona, Steward Observen_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.description.noteOpen access journal.en_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal published versionen_US
dc.source.journaltitleOptics express
refterms.dateFOA2019-06-19T22:14:07Z


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