Rectangular domain curl polynomial set for optical vector data processing and analysis
Affiliation
Univ Arizona, Steward ObservUniv Arizona, Large Opt Fabricat & Testing Grp
Issue Date
2019-09-24Keywords
measurement and metrologysurface measurements
numerical approximation and analysis
optical instrumentation
information processing
testing
Metadata
Show full item recordCitation
Maham Aftab, Logan R. Graves, James H. Burge, Greg A. Smith, Chang Jin Oh, and Dae Wook Kim "Rectangular domain curl polynomial set for optical vector data processing and analysis," Optical Engineering 58(9), 095105 (24 September 2019). https://doi.org/10.1117/1.OE.58.9.095105Journal
OPTICAL ENGINEERINGRights
Copyright © 2019 SPIE.Collection Information
This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.Abstract
Rectangular pupils are employed in many optical applications such as lasers and anamorphic optics, as well as for detection and metrology systems such as some Shack−Hartmann wavefront sensors and deflectometry systems. For optical fabrication, testing, and analysis in the rectangular domain, it is important to have a well-defined set of polynomials that are orthonormal over a rectangular pupil. Since we often measure the gradient of a wavefront or surface, it is necessary to have a polynomial set that is orthogonal over a rectangular pupil in the vector domain as well. We derive curl (called C) polynomials based on two-dimensional (2-D) versions of Chebyshev polynomials of the first kind. Previous work derived a set of polynomials (called G polynomials) that are obtained from the gradients of the 2-D Chebyshev polynomials. We show how the two sets together can be used as a complete representation of any vector data in the rectangular domain. The curl polynomials themselves or the complete set of G and C polynomials has many interesting applications. Two of those applications shown are systematic error analysis and correction in deflectometry systems and mapping imaging distortion.ISSN
0091-3286Version
Final published versionae974a485f413a2113503eed53cd6c53
10.1117/1.oe.58.9.095105
