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dc.contributor.authorMarty, Michael T
dc.date.accessioned2020-02-05T20:03:20Z
dc.date.available2020-02-05T20:03:20Z
dc.date.issued2019-08-07
dc.identifier.citationJ. Am. Soc. Mass Spectrom. 2019, 30, 10, 2174-2177en_US
dc.identifier.issn1044-0305
dc.identifier.pmid31392700
dc.identifier.doi10.1007/s13361-019-02286-4
dc.identifier.urihttp://hdl.handle.net/10150/636961
dc.description.abstractUniDec provides a rapid and robust approach to deconvolving electrospray mass spectra into their corresponding mass and charge components. However, the UniDec algorithm can produce artifacts depending on the quality and complexity of the data. Here, a SoftMax function is applied to the charge state distribution of each data point, which pushes the algorithm towards assigning each data point to one primary charge state. As shown for several data sets of increasing complexity, the SoftMax function significantly reduces deconvolution artifacts, even for data with overlapping charge states.en_US
dc.language.isoenen_US
dc.publisherSPRINGERen_US
dc.rightsCopyright © American Society for Mass Spectrometry, 2019en_US
dc.subjectDeconvolutionen_US
dc.subjectElectrosprayen_US
dc.subjectIntact massen_US
dc.subjectMass spectrometryen_US
dc.subjectNative MSen_US
dc.titleEliminating Artifacts in Electrospray Deconvolution with a SoftMax Functionen_US
dc.typeArticleen_US
dc.contributor.departmentUniv Arizona, Dept Chem & Biochemen_US
dc.identifier.journalJOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRYen_US
dc.description.note12 month embargo; published online: 7 August 2019en_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal accepted manuscripten_US
dc.source.journaltitleJournal of the American Society for Mass Spectrometry
dc.source.volume30
dc.source.issue10
dc.source.beginpage2174
dc.source.endpage2177
dc.source.countryUnited States
dc.source.countryUnited States


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