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dc.contributor.authorBrkic, Srdan
dc.contributor.authorIvanis, Predrag
dc.contributor.authorVasic, Bane
dc.date.accessioned2020-07-31T18:03:41Z
dc.date.available2020-07-31T18:03:41Z
dc.date.issued2015-12
dc.identifier.citationS. Brkic, P. Ivaniš and B. Vasić, "Reliability of Memories Built From Unreliable Components Under Data-Dependent Gate Failures," in IEEE Communications Letters, vol. 19, no. 12, pp. 2098-2101, Dec. 2015, doi: 10.1109/LCOMM.2015.2496266.en_US
dc.identifier.issn1089-7798
dc.identifier.doi10.1109/lcomm.2015.2496266
dc.identifier.urihttp://hdl.handle.net/10150/641954
dc.description.abstractIn this letter, we investigate fault-tolerance of memories built from unreliable cells. In order to increase the memory reliability, information is encoded by a low-density parity-check (LDPC) code, and then stored. The memory content is updated periodically by the bit-flipping decoder, built also from unreliable logic gates, whose failures are transient and data-dependent. Based on the expander property of Tanner graph of LDPC codes, we prove that the proposed memory architecture can tolerate a fixed fraction of component failures and consequently preserve all the stored information, if code length tends to infinity.en_US
dc.description.sponsorshipSeventh Framework Programme of the European Unionen_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsCopyright © IEEE.en_US
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en_US
dc.titleReliability of Memories Built From Unreliable Components Under Data-Dependent Gate Failuresen_US
dc.typeArticleen_US
dc.contributor.departmentUniv Arizona, Dept Elect & Comp Engnen_US
dc.identifier.journalIEEE COMMUNICATIONS LETTERSen_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal accepted manuscripten_US
dc.source.journaltitleIEEE Communications Letters
dc.source.volume19
dc.source.issue12
dc.source.beginpage2098
dc.source.endpage2101
refterms.dateFOA2020-07-31T18:03:54Z


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