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dc.contributor.authorValbuena, Luis
dc.contributor.authorHeileman, Gregory L.
dc.contributor.authorHemmady, Sameer
dc.contributor.authorSchamiloglu, Edl
dc.date.accessioned2020-09-14T23:04:25Z
dc.date.available2020-09-14T23:04:25Z
dc.date.issued2019-09
dc.identifier.citationValbuena, L., Heileman, G. L., Hemmady, S., & Schamiloglu, E. (2019, September). Simplified Flip-Flop Gate Model for EEMI Injection. In 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA) (pp. 0845-0850). IEEE.en_US
dc.identifier.doi10.1109/iceaa.2019.8879367
dc.identifier.urihttp://hdl.handle.net/10150/643349
dc.description.abstractWe present a second order dynamical system to represent the behavior of a D flip-flop. We employ windowing functions and vector fields to replicate a characteristic found in [1],which resorts to switching. The model also takes into account metastable behavior, which can be exploited when studying software execution faults due to an undefined logical state. We conceived the noise injection to be additive noise targeting the transition between the stable equilibrium points. However, the model is flexible and many parameters can be changed to alter its behavior.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rightsCopyright © 2019 IEEEen_US
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en_US
dc.source2019 International Conference on Electromagnetics in Advanced Applications (ICEAA)
dc.subjectFlip-Flopen_US
dc.subjectmodelingen_US
dc.subjectEEMIen_US
dc.titleSimplified Flip-Flop Gate Model for EEMI Injectionen_US
dc.typeArticleen_US
dc.contributor.departmentUniv Arizonaen_US
dc.identifier.journalPROCEEDINGS OF THE 2019 INTERNATIONAL CONFERENCE ON ELECTROMAGNETICS IN ADVANCED APPLICATIONS (ICEAA)en_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal accepted manuscripten_US
refterms.dateFOA2020-09-14T23:04:25Z


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