Robust and objective automatic optical surface inspection using modulated dark field phasing illumination
AffiliationUniv Arizona, James C Wyant Coll Opt Sci
Univ Arizona, Dept Astron
MetadataShow full item record
PublisherSPIE-INT SOC OPTICAL ENGINEERING
CitationChoi, H., Kam, J., Berkson, J. D., Graves, L. R., Lei, H., & Kim, D. W. (2019, September). Robust and objective automatic optical surface inspection using modulated dark field phasing illumination. In Applied Optical Metrology III (Vol. 11102, p. 1110207). International Society for Optics and Photonics.
JournalAPPLIED OPTICAL METROLOGY III
Rights© 2019 SPIE
Collection InformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at email@example.com.
AbstractDark field illumination (DFI) is an elegant inspection technique sometimes used to detect particles on a specular surface. However, traditional DFI struggles with repeatability, limiting its applications in automated inspection. We present an improvement to DFI by introducing a modulated dark field illumination (MDFI) that utilizes the phase rather than the intensity in the detection of defects. For modulated dark field illumination (MDFI), the phase-based information is independent from the reflectance of the surface, but has a higher sensitivity to the light scattered from a defect than DFI. As a result, we obtain a robust computational image process method that is insensitive to the environment and provides clearly defined defect information. In order to extend the application to industry, the instantaneous MDFI systems were developed and validated.
VersionFinal published version