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dc.contributor.authorHao, Qing
dc.contributor.authorXiao, Yue
dc.date.accessioned2021-04-14T22:22:31Z
dc.date.available2021-04-14T22:22:31Z
dc.date.issued2020-06-08
dc.identifier.citationHao, Q., & Xiao, Y. (2020). Periodic Nanoslot Patterns as an Effective Approach to Improving the Thermoelectric Performance of Thin Films. Physical Review Applied, 13(6), 064020.en_US
dc.identifier.issn2331-7019
dc.identifier.doi10.1103/physrevapplied.13.064020
dc.identifier.urihttp://hdl.handle.net/10150/657715
dc.description.abstractFor thermoelectric applications, thermoelectric Si thin films with periodic circular pores have been intensively studied because of the low price and earth abundance of Si. In this work, a different periodic nanoporous pattern is investigated for its potential thermoelectric benefit, i.e., a Si thin film with periodic nanoslots. Inside such structures, the neck between adjacent nanoslots functions as the nanorestriction to suppress the phonon transport, leading to a dramatically reduced lattice thermal conductivity. When the neck width is still longer than the mean free paths of majority charge carriers, bulklike electron transport can be maintained so that the thermoelectric ZT can be enhanced. For the thermal designs of these porous thin films, a simple but accurate analytical model based on the mean-free-path modification with a characteristic length is derived and is used to predict their thermoelectric properties. For heavily doped Si films with the neck width reduced to 5 nm, the computed ZT can reach 0.58 at 1100 K. The proposed nanoslot pattern can be extended to general thin films and atomic thick materials to tune their transport properties.en_US
dc.description.sponsorshipAir Force Office of Scientific Researchen_US
dc.language.isoenen_US
dc.publisherAMER PHYSICAL SOCen_US
dc.rights© 2020 American Physical Society.en_US
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.titlePeriodic Nanoslot Patterns as an Effective Approach to Improving the Thermoelectric Performance of Thin Filmsen_US
dc.typeArticleen_US
dc.identifier.eissn2331-7019
dc.contributor.departmentUniv Arizona, Dept Aerosp & Mech Engnen_US
dc.identifier.journalPHYSICAL REVIEW APPLIEDen_US
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.en_US
dc.eprint.versionFinal published versionen_US
dc.source.journaltitlePhysical Review Applied
dc.source.volume13
dc.source.issue6
refterms.dateFOA2021-04-14T22:22:33Z


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