Affiliation
Univ Arizona, Wyant Coll Opt SciUniv Arizona, Large Binocular Telescope Observ
Univ Arizona, Dept Astron & Steward Observ
Univ Arizona, Lunar & Planetary Lab
Issue Date
2020-08-20Keywords
Metrologyin-process metrology
wide dynamic range and high precision test
multi-segmented optics
Metadata
Show full item recordPublisher
SPIE-INT SOC OPTICAL ENGINEERINGCitation
Choi, H., Esparza, M. A., Lamdan, A., Feng, Y. T., Milster, T., Apai, D., & Kim, D. W. (2020, August). In-process metrology for segmented optics UV curing control. In Optical Manufacturing and Testing XIII (Vol. 11487, p. 114870M). International Society for Optics and Photonics.Rights
© 2020 SPIE.Collection Information
This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.Abstract
Powerful and novel telescope design is key to pushing the available limits of astronomical sciences and a segmented primary is an attractive approach. For the Nautilus Space mission, a segmented lens has been proposed to replace large monolithic primary optics for the purpose of survey faint objects like exo-planets as well as time-domain astrophysics observations. Enabling technology for Nautilus is an ultra-lightweight multi-order diffractive engineered (MODE) lens that replaces bulky primary mirrors. The MODE lens consists of multiple, identical, molded segments. This is because the complicated optical design of both the diffractive surfaces is not easily manufacturable by traditional fabrication methods. Besides, the molding approach for identical segmented optics allows for a cost-efficient process. Conversely, the fusion of segmented optics demands high precision metrology and a delicate assembly strategy. We propose an in-process metrology technique that mitigates post-assembly process complications. This system monitors the co-phase character of the segmented optics during UV cured assembly, guiding the overall process.ISSN
0277-786XVersion
Final published versionae974a485f413a2113503eed53cd6c53
10.1117/12.2569310
