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    In-process metrology for segmented optics UV curing control

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    Author
    Choi, Heejoo
    Esparza, Marcos
    Lamdan, Ariel
    Feng, Yi-Ting
    Milster, Tom
    Apai, Daniel
    Kim, Dae Wook
    Affiliation
    Univ Arizona, Wyant Coll Opt Sci
    Univ Arizona, Large Binocular Telescope Observ
    Univ Arizona, Dept Astron & Steward Observ
    Univ Arizona, Lunar & Planetary Lab
    Issue Date
    2020-08-20
    Keywords
    Metrology
    in-process metrology
    wide dynamic range and high precision test
    multi-segmented optics
    
    Metadata
    Show full item record
    Publisher
    SPIE-INT SOC OPTICAL ENGINEERING
    Citation
    Choi, H., Esparza, M. A., Lamdan, A., Feng, Y. T., Milster, T., Apai, D., & Kim, D. W. (2020, August). In-process metrology for segmented optics UV curing control. In Optical Manufacturing and Testing XIII (Vol. 11487, p. 114870M). International Society for Optics and Photonics.
    Journal
    OPTICAL MANUFACTURING AND TESTING XIII
    Rights
    © 2020 SPIE.
    Collection Information
    This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.
    Abstract
    Powerful and novel telescope design is key to pushing the available limits of astronomical sciences and a segmented primary is an attractive approach. For the Nautilus Space mission, a segmented lens has been proposed to replace large monolithic primary optics for the purpose of survey faint objects like exo-planets as well as time-domain astrophysics observations. Enabling technology for Nautilus is an ultra-lightweight multi-order diffractive engineered (MODE) lens that replaces bulky primary mirrors. The MODE lens consists of multiple, identical, molded segments. This is because the complicated optical design of both the diffractive surfaces is not easily manufacturable by traditional fabrication methods. Besides, the molding approach for identical segmented optics allows for a cost-efficient process. Conversely, the fusion of segmented optics demands high precision metrology and a delicate assembly strategy. We propose an in-process metrology technique that mitigates post-assembly process complications. This system monitors the co-phase character of the segmented optics during UV cured assembly, guiding the overall process.
    ISSN
    0277-786X
    DOI
    10.1117/12.2569310
    Version
    Final published version
    ae974a485f413a2113503eed53cd6c53
    10.1117/12.2569310
    Scopus Count
    Collections
    UA Faculty Publications

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