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dc.contributor.authorDrake, J.J.
dc.contributor.authorCheimets, P.
dc.contributor.authorGarraffo, C.
dc.contributor.authorWargelin, B.
dc.contributor.authorYoungblood, A.
dc.contributor.authorKashyap, V.L.
dc.contributor.authorTesta, P.
dc.contributor.authorCaldwell, D.
dc.contributor.authorMason, J.
dc.contributor.authorFleming, B.
dc.contributor.authorFrance, K.
dc.contributor.authorWolk, S.
dc.contributor.authorSiegmund, O.
dc.contributor.authorKoskinen, T.
dc.contributor.authorAlvarado-Gomez, J.
dc.contributor.authorLopez-Morales, M.M.
dc.contributor.authorGronoff, G.
dc.contributor.authorBookbinder, J.
dc.contributor.authorBarstow, M.
dc.contributor.authorWindt, D.
dc.contributor.authorGladstone, R.
dc.contributor.authorLoghry, C.
dc.contributor.authorYarbrough, R.
dc.date.accessioned2021-11-29T20:24:57Z
dc.date.available2021-11-29T20:24:57Z
dc.date.issued2021
dc.identifier.citationDrake, J. J., Cheimets, P., Garraffo, C., Wargelin, B., Youngblood, A., Kashyap, V. L., Testa, P., Caldwell, D., Mason, J., Fleming, B., France, K., Wolk, S., Siegmund, O., Koskinen, T., Alvarado-Gomez, J., Lopez-Morales, M. M., Gronoff, G., Bookbinder, J., Barstow, M., … Yarbrough, R. (2021). NExtUP: The Normal-incidence Extreme Ultraviolet Photometer. Proceedings of SPIE - The International Society for Optical Engineering.
dc.identifier.isbn9781510644809
dc.identifier.issn0277-786X
dc.identifier.doi10.1117/12.2594408
dc.identifier.urihttp://hdl.handle.net/10150/662396
dc.description.abstractThe Normal-incidence Extreme Ultraviolet Photometer (NExtUP) is a smallsat mission concept designed to measure the EUV radiation conditions of exoplanet host stars, and F-M type stars in general. EUV radiation is absorbed at high altitude in a planetary atmosphere, in the exosphere and upper thermosphere, where the gas can be readily heated to escape temperatures. EUV heating and ionization are the dominant atmospheric loss drivers during most of a planets life. There are only a handful of accurately measured EUV stellar fluxes, all dating from Extreme Ultraviolet Explorer (EUVE) observations in the †90s. Consequently, current models of stellar EUV emission are uncertain by more than an order of magnitude and dominate uncertainties in planetary atmospheric loss models. NExtUP will use periodic and aperiodic multilayers on off-Axis parabolic mirrors and a prime focus microchannel plate detector to image stars in 5 bandpasses between 150 and 900°A down to flux limits two orders of magnitude lower than reached by EUVE. NExtUP may also accomplish a compelling array of secondary science goals, including using line-of-sight absorption measurements to understand the structure of the local interstellar medium, and imaging EUV emission from energetic processes on solar system objects at unprecedented spatial resolution. NExtUP is well within smallsat weight limits, requires no special orbital conditions, and would be flown on a spacecraft supplied by MOOG Industries. It draws on decades of mission heritage expertise at SAO and LASP, including similar instruments successfully launched and operated to observe the Sun. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
dc.language.isoen
dc.publisherSPIE
dc.rightsCopyright © 2021 SPIE.
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectEUV
dc.subjectEUV detectors
dc.subjectEUV optics
dc.subjectExoplanets
dc.subjectFlares
dc.subjectMCPs
dc.subjectSmallSat
dc.subjectSpace Missions
dc.subjectStars
dc.titleNExtUP: The Normal-incidence Extreme Ultraviolet Photometer
dc.typeProceedings
dc.typetext
dc.contributor.departmentLunar and Planetary Laboratory, University of Arizona
dc.identifier.journalProceedings of SPIE - The International Society for Optical Engineering
dc.description.noteImmediate access
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.
dc.eprint.versionFinal published version
dc.source.journaltitleProceedings of SPIE - The International Society for Optical Engineering
refterms.dateFOA2021-11-29T20:24:57Z


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