Author
Nieken, R.Roche, A.
Mahdikhanysarvejahany, F.
Taniguchi, T.
Watanabe, K.
Koehler, M.R.
Mandrus, D.G.
Schaibley, J.
Leroy, B.J.
Affiliation
Department of Physics, University of ArizonaIssue Date
2022
Metadata
Show full item recordPublisher
American Institute of Physics Inc.Citation
Nieken, R., Roche, A., Mahdikhanysarvejahany, F., Taniguchi, T., Watanabe, K., Koehler, M. R., Mandrus, D. G., Schaibley, J., & Leroy, B. J. (2022). Direct STM measurements of R-type and H-type twisted MoSe2/WSe2. APL Materials.Journal
APL MaterialsRights
Copyright © 2022 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).Collection Information
This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.Abstract
When semiconducting transition metal dichalcogenide heterostructures are stacked, the twist angle and lattice mismatch lead to a periodic moiré potential. As the angle between the layers changes, so do the electronic properties. As the angle approaches 0° or 60°, interesting characteristics and properties, such as modulations in the band edges, flat bands, and confinement, are predicted to occur. Here, we report scanning tunneling microscopy and spectroscopy measurements on the bandgaps and band modulations in MoSe2/WSe2 heterostructures with near 0° rotation (R-type) and near 60° rotation (H-type). We find a modulation of the bandgap for both stacking configurations with a larger modulation for R-type than for H-type as predicted by theory. Furthermore, local density of states images show that electrons are localized differently at the valence band and conduction band edges. © 2022 Author(s).Note
Open access journalISSN
2166-532XVersion
Final published versionae974a485f413a2113503eed53cd6c53
10.1063/5.0084358
Scopus Count
Collections
Except where otherwise noted, this item's license is described as Copyright © 2022 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).