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dc.contributor.authorYoo, H.
dc.contributor.authorDubin, M.
dc.date.accessioned2022-12-15T22:40:04Z
dc.date.available2022-12-15T22:40:04Z
dc.date.issued2022
dc.identifier.citationYoo, H., & Dubin, M. (2022). Impact of the LCD monitor locations on a novel alignment method: The combination of deflectometry and the sine condition test. Proceedings of SPIE - The International Society for Optical Engineering, 12222.
dc.identifier.isbn9781510654280
dc.identifier.issn0277-786X
dc.identifier.doi10.1117/12.2639735
dc.identifier.urihttp://hdl.handle.net/10150/667179
dc.description.abstractWe have proposed a new alignment method which is the combination of deflectometry and the sine condition test. One of the great advantages of the new approach is that we need a camera and an LCD monitor larger than the clear aperture of the telescope instead of an interferometer and a return flat. To determine the state of the alignment, we have to place the monitor at two different locations: ideally at the rear principal plane of the telescope and a few meters displaced from the rear principal plane. However, for practical reasons, we may have to place the monitor closer to the telescope. We have simulated how changing the monitor location impacts the alignment, and we show the consequences of variations in the LCD locations on the alignment of a telescope using the new method. Copyright © 2022 SPIE.
dc.language.isoen
dc.publisherSPIE
dc.rightsCopyright © 2022 SPIE.
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectAlignment
dc.subjectdeflectometry
dc.subjectsine condition test
dc.titleImpact of the LCD monitor locations on a novel alignment method: The combination of deflectometry and the sine condition test
dc.typeProceedings
dc.typetext
dc.contributor.departmentWyant College of Optical Sciences, University of Arizona
dc.identifier.journalProceedings of SPIE - The International Society for Optical Engineering
dc.description.noteImmediate access
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.
dc.eprint.versionFinal published version
dc.source.journaltitleProceedings of SPIE - The International Society for Optical Engineering
refterms.dateFOA2022-12-15T22:40:04Z


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