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    Absolute surface metrology of X-ray telescope mirrors through axial shift mapping

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    Author
    Wisniewski, H.J.
    Heilmann, R.K.
    Schattenburg, M.L.
    Chalifoux, B.D.
    Affiliation
    James C. Wyant College of Optical Sciences, The University of Arizona
    Issue Date
    2023-10-05
    Keywords
    absolute metrology
    computer generated hologram
    interferometric metrology methods
    optical metrology
    X-ray mirror metrology
    X-ray telescope
    
    Metadata
    Show full item record
    Publisher
    SPIE
    Citation
    Hayden J. Wisniewski, Ralf K. Heilmann, Mark L. Schattenburg, Brandon D. Chalifoux, "Absolute surface metrology of x-ray telescope mirrors through axial shift mapping," Proc. SPIE 12679, Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI, 126790Q (5 October 2023); https://doi.org/10.1117/12.2677596
    Journal
    Proceedings of SPIE - The International Society for Optical Engineering
    Rights
    © 2023 SPIE.
    Collection Information
    This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.
    Abstract
    The next generation of X-ray telescopes will require mirror segments to be characterized to a surface uncertainty of 5 nm RMS or better. We present axial shift mapping, a Fizeau interferometry method to characterized near-cylindrical null correctors and surfaces. We extend our previously tested technique to cylindrical optics of similar dimensions to X-ray telescope mirrors. We report on progress towards full surface extraction of a cylindrical optic using axial shift mapping. © 2023 SPIE.
    Note
    Immediate access
    ISSN
    0277-786X
    ISBN
    978-151066572-9
    DOI
    10.1117/12.2677596
    Version
    Final Published Version
    ae974a485f413a2113503eed53cd6c53
    10.1117/12.2677596
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    UA Faculty Publications

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