Absolute surface metrology of X-ray telescope mirrors through axial shift mapping
Affiliation
James C. Wyant College of Optical Sciences, The University of ArizonaIssue Date
2023-10-05Keywords
absolute metrologycomputer generated hologram
interferometric metrology methods
optical metrology
X-ray mirror metrology
X-ray telescope
Metadata
Show full item recordPublisher
SPIECitation
Hayden J. Wisniewski, Ralf K. Heilmann, Mark L. Schattenburg, Brandon D. Chalifoux, "Absolute surface metrology of x-ray telescope mirrors through axial shift mapping," Proc. SPIE 12679, Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI, 126790Q (5 October 2023); https://doi.org/10.1117/12.2677596Rights
© 2023 SPIE.Collection Information
This item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.Abstract
The next generation of X-ray telescopes will require mirror segments to be characterized to a surface uncertainty of 5 nm RMS or better. We present axial shift mapping, a Fizeau interferometry method to characterized near-cylindrical null correctors and surfaces. We extend our previously tested technique to cylindrical optics of similar dimensions to X-ray telescope mirrors. We report on progress towards full surface extraction of a cylindrical optic using axial shift mapping. © 2023 SPIE.Note
Immediate accessISSN
0277-786XISBN
978-151066572-9Version
Final Published Versionae974a485f413a2113503eed53cd6c53
10.1117/12.2677596
