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dc.contributor.authorSu, R.
dc.contributor.authorChoi, H.
dc.contributor.authorKim, D.
dc.contributor.authorSchwiegerling, J.
dc.date.accessioned2024-03-22T01:37:42Z
dc.date.available2024-03-22T01:37:42Z
dc.date.issued2023-10-04
dc.identifier.citationRebecca Su, Heejoo Choi, Daewook Kim, James Schwiegerling, "Deflectometry for ophthalmic optics testing and the impact of test surface orientation," Proc. SPIE 12672, Applied Optical Metrology V, 1267206 (4 October 2023); https://doi.org/10.1117/12.2676217
dc.identifier.isbn978-151066558-3
dc.identifier.issn0277-786X
dc.identifier.doi10.1117/12.2676217
dc.identifier.urihttp://hdl.handle.net/10150/671449
dc.description.abstractThe effects of the misalignment of a test surface in a deflectometry system were explored. A Stewart Platform Hexapod stage was used to create the intentional misalignment, rotate the test surface position around the X and Y axes as well as displace their Z location. The measured surface maps were analyzed in coefficients of a fit of the surface map to the Zernike coefficients. The Zernike term results were adopted to show the relationship between the induced pose changes and the reconstructed surface map. Such an understanding of the errors in location and orientation and deflectometry measurement results would be beneficial in the future measurement of ophthalmic optics with a deflectometry system. © 2023 SPIE. All rights reserved.
dc.language.isoen
dc.publisherSPIE
dc.rights© 2023 SPIE.
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectdeflectometry
dc.subjectmisalignment
dc.subjectophthalmology
dc.subjectoptical testing
dc.subjectStewart Platform
dc.titleDeflectometry for ophthalmic optics testing and the impact of test surface orientation
dc.typeProceedings
dc.typetext
dc.contributor.departmentWyant College of Optical Sciences, University of Arizona
dc.contributor.departmentLarge Binocular Telescope Observatory, University of Arizona
dc.contributor.departmentDepartment of Astronomy and Steward Observatory, University of Arizona
dc.identifier.journalProceedings of SPIE - The International Society for Optical Engineering
dc.description.noteImmediate access
dc.description.collectioninformationThis item from the UA Faculty Publications collection is made available by the University of Arizona with support from the University of Arizona Libraries. If you have questions, please contact us at repository@u.library.arizona.edu.
dc.eprint.versionFinal Published Version
dc.source.journaltitleProceedings of SPIE - The International Society for Optical Engineering
refterms.dateFOA2024-03-22T01:37:42Z


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